Lifespan Modeling of Insulation Materials for Low Voltage Machines: films and twisted pairs
Affiliations : 1 - Laboratoire LAPLACE (France), 2 - Institut de recherche en informatique de Toulouse (France)
This paper deals with the modeling of insulation material lifespan in a partial discharge regime. Accelerated aging tests are carried out to determine the lifespan of polyesterimide insulation films under different various stress conditions. The insulation lifespan logarithm is modeled as a function of different factors: the electrical stress logarithms and of an exponential form of the temperature. The model parameters, or so-called factor effects, is estimated on a training set. The significance of the factors is evaluated through the analysis of variance (ANOVA). In a first step, the design of experiment method (DoE) is considered. The associated lifespan model is linear with respect to the factors. This method is well-known for reducing the number of experiments while providing a good accuracy. In a second step, the response surface method (RSm) is considered. This method takes also into account some second order terms and thus possible interactions between the stress factors. Performance of the two methods are analyzed and compared on a test set.